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Datasheet: I74F133N (Philips Semiconductors)

13.input NAND Gate

 

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Philips Semiconductors
Philips Semiconductors Products
Product specification
FAST 74F133
13­input NAND Gate
1
July 2, 1993
853-10219
FAST Products
PRODUCT SPECIFICATION
TYPE
TYPICAL PROPAGATION
DELAY
TYPICAL SUPPLY CURRENT
(TOTAL)
74F133
4.0ns
2.0 mA
ORDERING INFORMATION
ORDER CODE
COMMERCIAL RANGE
INDUSTRIAL RANGE
DESCRIPTION
V
CC
= 5V
±
10%,
V
CC
= 5V
±
10%,
T
amb
= 0
°
C to +70
°
C
T
amb
= ­40
°
C to +85
°
C
16­pin plastic DIP
N74F133N
I74F133N
16­pin plastic SO
N74F133D
I74F133D
INPUT AND OUTPUT LOADNG AND FAN OUT TABLE
PINS
DESCRIPTION
74F (U.L.)
HIGH/LOW
LOAD VALUE
HIGH/LOW
D
O
- D
12
Data inputs
1.0/1.0
20
µ
A/0.6mA
Q
Data output
50/33
1.0mA/20mA
Note to input and output loading and fan out table
1. One (1.0) FAST unit load is defined as: 20
µ
A in the high state and 0.6mA in the low state.
PIN CONFIGURATION LOGIC SYMBOL LOGIC SYMBOL (IEEE/IEC)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
16
15
VCC
=
Pin 16
GND = Pin 8
1
2
3
4
5
6
7
10
11
12
13
14
15
1
2
3
4
5
6
7
10
11
12
13
14
15
9
&
V
CC
D
12
D
11
D
10
D
9
D
8
D
7
Q
D
0
D
1
D
2
D
3
D
4
D
5
D
6
GND
Philips Semiconductors Products
Product specification
FAST 74F133
13­input NAND Gate
July 2, 1993
2
LOGIC DIAGRAM
VCC = Pin 16
GND = Pin 8
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
D10 D11
D12
Q
9
1
2
3
4
5
6
7
10 11
12 13 14 15
FUNCTION TABLE
INPUTS
OUTPUT
DO
D1
D2
D3
D4
D5
D6
D7
D8
D9
D10
D11
D12
Q
H
H
H
H
H
H
H
H
H
H
H
H
H
L
Any one input = L
H
Philips Semiconductors Products
Product specification
FAST 74F133
13­input NAND Gate
July 2, 1993
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
Supply voltage
­0.5 to +7.0
V
V
IN
Input voltage
­0.5 to +7.0
V
I
IN
Input current
­30 to +5
mA
V
OUT
Voltage applied to output in high output state
­0.5 to V
CC
V
I
OUT
Current applied to output in low output state
40
mA
T
amb
Operating free air temperature range
Commercial range
0 to +70
°
C
Industrial range
­40 to +85
°
C
T
stg
Storage temperature range
­65 to +150
°
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
High­level input voltage
2.0
V
V
IL
Low­level input voltage
0.8
V
I
Ik
Input clamp current
­18
mA
I
OH
High­level output current
­1
mA
I
OL
Low­level output current
20
mA
T
amb
Operating free air temperature range
Commercial range
0
+70
°
C
Industrial range
­40
+85
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
V
OH
High-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
2.5
V
V
IH
= MIN, I
OH
= MAX
±
5%V
CC
2.7
3.4
V
V
OL
Low-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
0.35
0.50
V
V
IH
= MIN, I
Ol
= MAX
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
-0.73
-1.2
V
I
I
Input current at maximum input voltage
V
CC
= MAX, V
I
= 7.0V
100
µ
A
I
IH
High­level input current
V
CC
= MAX, V
I
= 2.7V
20
µ
A
I
IL
Low­level input current
V
CC
= MAX, V
I
= 0.5V
-0.6
mA
I
OS
Short-circuit output current
3
V
CC
= MAX
-60
-150
mA
I
CC
Supply current (total)
I
CCH
V
CC
= MAX
1.0
2.0
mA
I
CCL
V
CC
= MAX
2.5
4.0
mA
NOTES:
1.. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3.. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Philips Semiconductors Products
Product specification
FAST 74F133
13­input NAND Gate
July 2, 1993
4
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25
°
C
T
amb
= 0
°
C to
+70
°
C
T
amb
= ­40
°
C to +85
°
C
SYMBOL
PARAMETER
TEST
V
CC
= +5.0V
V
CC
= +5.0V
±
10%
V
CC
= +5.0V
±
10%
UNIT
CONDITION
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
MIN
TYP
MAX
MIN
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
Dn to Qn
Waveform 1
2.0
2.5
4.0
4.5
7.0
7.5
1.5
2.0
7.5
8.0
1.5
2.0
7.5
8.0
ns
AC WAVEFORMS
VM
VM
VM
VM
Waveform 1. Propagation delay for data to output
Q
Dn
tPHL
tPLH
Note to AC Waveforms
1. For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
tw
90%
VM
10%
90%
VM
10%
90%
VM
10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
0V
0V
tTHL (tf
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz
500ns 2.5ns
2.5ns
Input pulse definition
VCC
family
74F
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN
VOUT
Test circuit for totem-pole outputs
DEFINITIONS:
R
L
= Load resistor;
see AC electrical characteristics for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
tTHL (tf
)
tTLH (tr
)
tTLH (tr
)
AMP (V)
amplitude
3.0V
1.5V
v
M
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