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Datasheet: 100314MDS (National Semiconductor)

Low Power Quint Differential Line Receiver, Package: Cerquad, Pin Nb=24

 

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National Semiconductor
100314
Low Power Quint Differential Line Receiver
General Description
The 100314 is a monolithic quint differential line receiver with
emitter-follower outputs. An internal reference supply (V
BB
)
is available for single-ended reception. When used in
single-ended operation the apparent input threshold of the
true inputs is 25 mV to 30 mV higher (positive) than the
threshold of the complementary inputs. Unlike other F100K
ECL devices, the inputs do not have input pull-down resis-
tors.
Active current sources provide common-mode rejection of
1.0V in either the positive or negative direction. A defined
output state exists if both inverting and non-inverting inputs
are at the same potential between V
EE
and V
CC
. The defined
state is logic HIGH on the O
a
O
e
outputs.
Features
n
35% power reduction of the 100114
n
2000V ESD protection
n
Pin/function compatible with 100114
n
Voltage compensated operating range = -4.2V to -5.7V
n
Standard Microcircuit Drawing
(SMD) 5962-9162901
Logic Symbol
Pin Names
Description
D
a
D
e
Data Inputs
D
a
D
e
Inverting Data Inputs
O
a
O
e
Data Outputs
O
a
O
e
Complementary Data Outputs
DS100299-1
August 1998
100314
Low
Power
Quint
Differential
Line
Receiver
1998 National Semiconductor Corporation
DS100299
www.national.com
Connection Diagrams
24-Pin DIP
DS100299-2
24-Pin Quad Cerpak
DS100299-3
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2
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired (Note 1)
Storage Temperature (T
STG
)
-65C to +150C
Maximum Junction Temperture (T
J
)
Ceramic
+175C
Pin Potential to Ground Pin (V
EE
)
-7.0V to +0.5V
Input Voltage (DC)
V
EE
to +0.5V
Output Current (DC Output HIGH)
-50 mA
ESD (Note 2)
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
-55C to +125C
Supply Voltage (V
EE
)
-5.7V to -4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
= -4.2V to -5.7V, V
CC
= V
CCA
= GND, T
C
= -55C to +125C (Note 5)
Symbol
Parameter
Min
Typ
Max
Units
T
C
Conditions
Notes
V
OH
Output HIGH
Voltage
-1025
-870
mV
0C to
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50
to -2.0V
+125C
-1085
-870
mV
-55C
(Notes 3, 4, 5)
V
OL
Output LOW Voltage
-1830
-1620
mV
0C to
+125C
-1830
-1555
mV
-55C
V
OHC
Output HIGH
-1035
mV
0C to
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50
to -2.0V
Voltage
+125C
-1085
mV
-55C
(Notes 3, 4, 5)
V
OLC
Output LOW
-1610
mV
0C to
Voltage
+125C
-1555
mV
-55C
V
BB
Output Reference
-1260
mV
0C to
I
VBB
= 0 A, V
EE
= 4.2V
(Notes 3, 4, 5)
Voltage
+125C
-1380
-1260
mV
0C to
I
VBB
= -250 A, V
EE
= -5.7V
+125C
(Notes 3, 4, 5)
-1396
mV
-55C
I
VBB
= -350 A, V
EE
= -5.7V
V
DIFF
Input Voltage
150
mV
-55C to
Required for Full Output Swing
(Notes 3, 4, 5)
Differential
+125C
V
CM
Common Mode
V
CC
- 2.0
V
CC
- 0.5
V
-55C to
(Notes 3, 4, 5)
Voltage
+125C
V
IH
Single-Ended
-1165
-870
mV
-55C to
Guaranteed HIGH Signal for All
(Notes 3, 4, 5, 6)
Input High Voltage
+125C
Inputs (with D
n
tied to V
BB
)
V
IL
Single-Ended
-1830
-1475
mV
-55C to
Guaranteed LOW Signal for All
(Notes 3, 4, 5, 6)
Input Low Voltage
+125C
Inputs (with D
n
tied to V
BB
)
I
IH
Input HIGH Current
50
A
0C to
V
IN
= V
IH (Max)
, D
a
D
e
= V
BB
,
+125C
D
a
D
e
= V
IL (Min)
(Notes 3, 4, 5)
70
A
-55C
I
CBO
Input Leakage
-10
A
-55C to
V
IN
= V
EE
, D
a
D
e
= V
BB
,
(Notes 3, 4, 5)
Current
+125C
D
a
D
e
= V
IL (Min)
I
EE
Power Supply
-65
-25
mA
-55C to
D
a
D
e
= V
BB
,
(Notes 3, 4, 5)
Current
+125C
D
a
D
e
= V
IL (Min)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides "cold start" specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at -55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at -55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
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3
AC Electrical Characteristics
V
EE
= -4.2V to -5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
=
-55C
T
C
=
+25C
T
C
=
+125C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
PLH
Propagation Delay
0.40
2.30
0.60
2.20
0.60
2.70
ns
(Notes 7, 8, 9)
t
PHL
Data to Output
Figures 1, 2
t
TLH
Transition Time
0.20
1.40
0.20
1.40
0.20
1.40
ns
(Note 10)
t
THL
20% to 80%, 80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately
after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and -55C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25C, +125C and -55C temperature (design characterization data).
Test Circuit
DS100299-5
Note: V
CC
, V
CCA
= +2V, V
EE
= -2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 F from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
3 pF
FIGURE 1. AC Test Circuit
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4
Switching Waveforms
DS100299-6
FIGURE 2. Propagation Delay and Transition Times
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5
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