HTML datasheet archive (search documentation on electronic components) Search datasheet (1.687.043 components)
Search field

Datasheet: 100307F (National Semiconductor)

Low Power Quint Exclusive OR/NOR Gate

 

Download: PDF   ZIP
National Semiconductor
100307
Low Power Quint Exclusive OR/NOR Gate
General Description
The 100307 is monolithic quint exclusive-OR/NOR gate. The
Function output is the wire-OR of all five exclusive-OR out-
puts. All inputs have 50 k
pull-down resistors.
Features
n
Low Power Operation
n
2000V ESD protection
n
Pin/function compatible with 100107
n
Voltage compensated operating range = -4.2V to -5.7V
n
Available to industrial grade temperature range
n
Available to Standard Microcircuit Drawing
(SMD) 5962-9459001
Logic Symbol
Logic Equation
F = (D
1a
%
D
2a
) + (D
1b
%
D
2b
) + (D
1c
%
D
2c
) + (D
1d
%
D
2d
)
+ (D
1e
%
D
2e
).
Pin Names
Description
D
na
D
ne
Data Inputs
F
Function Output
O
a
O
e
Data Outputs
O
a
O
e
Complementary
Data Outputs
DS100305-1
August 1998
100307
Low
Power
Quint
Exclusive
OR/NOR
Gate
1998 National Semiconductor Corporation
DS100305
www.national.com
Connection Diagrams
24-Pin DIP
DS100305-2
24-Pin Quad Cerpak
DS100305-3
www.national.com
2
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired. (Note 1)
Storage Temperature (T
STG
)
-65C to +150C
Maximum Junction Temperature (T
J
)
Ceramic
+175C
Plastic
+150C
V
EE
Pin Potential to Ground Pin
-7.0V to +0.5V
Input Voltage (DC)
V
EE
to +0.5V
Output Current (DC Output HIGH)
-50 mA
ESD (Note 2)
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
-55C to +125C
Supply Voltage (V
EE
)
-5.7V to -4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
= -4.2V to -5.7V, V
CC
= V
CCA
= GND, T
C
= -55C to +125C
Symbol
Parameter
Min
Max
Units
T
C
Conditions
Notes
V
OH
Output HIGH Voltage
-1025
-870
mV
0C to
+125C
-1085
-870
mV
-55C
V
IN
= V
IH
(Max)
Loading with
1, 2, 3
V
OL
Output LOW Voltage
-1830
-1620
mV
0C to
or V
IL
(Min)
50
to -2.0V
+125C
-1830
-1555
mV
-55C
V
OHC
Output HIGH Voltage
-1035
mV
0C to
+125C
-1085
mV
-55C
V
IN
= V
IH
(Min)
Loading with
1, 2, 3
V
OLC
Output LOW Voltage
-1610
mV
0C to
or V
IL
(Max)
50
0 to -2.0V
+125C
-1555
mV
-55C
V
IH
Input HIGH Voltage
-1165
-870
mV
-55C
Guaranteed HIGH Signal
1, 2, 3, 4
+125C
for All Inputs
V
IL
Input LOW Voltage
-1830
-1475
mV
-55C to
Guaranteed LOW Signal
1, 2, 3,4
+125C
for All Inputs
I
IL
Input LOW Current
0.50
A
-55C to
V
EE
= -4.2V
1, 2, 3
+125C
V
IN
= V
IL
(Min)
I
IH
Input High Current
D
2a
D
2e
250
A
0C to
D
1a
D
1e
350
+125C
V
EE
= -5.7V
1, 2, 3
D
2a
D
2e
350
A
-55C
V
IN
= V
IH
(Max)
D
1a
D
1e
500
I
EE
Power Supply Current
-75
-25
mA
-55C to
Inputs Open
1, 2, 3
+125C
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides "cold start" specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at -55C, +25C, and +125C, Subgroups 1, 2 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at -55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
www.national.com
3
AC Electrical Characteristics
V
EE
= -4.2V to -5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= -55C
T
C
= +25C
T
C
= +125C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
PLH
Propagation Delay
0.30
2.10
0.40
1.90
0.40
2.40
ns
t
PHL
D
2a
D
2e
to O, O
t
PLH
Propagation Delay
0.30
1.90
0.40
1.80
0.40
2.20
ns
1, 2, 3
t
PHL
D
1a
D
1e
to O, O
Figures 1, 2
t
PLH
Propagation Delay
0.80
2.90
0.90
2.80
0.90
3.40
ns
t
PHL
Data to F
t
TLH
Transition Time
0.20
1.70
0.30
1.60
0.20
1.70
ns
4
t
THL
20% to 80%, 80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately
after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25C, Subgroup A9, and at +125C and -55C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25C, +125C, and -55C temperature (design characterization data).
Test Circuitry
DS100305-5
Notes:
V
CC
, V
CCA
= +2V, V
EE
= -2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 F from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
3 pF
FIGURE 1. AC Test Circuit
www.national.com
4
Switching Waveforms
DS100305-6
FIGURE 2. Propagation Delay and Transition Times
www.national.com
5
© 2018 • ICSheet
Contact form
Main page